Non-Destructive Prediction of Seed Viability In Eggplant Using the X-Ray Imaging.

The potential of the X-ray imaging was evaluated for application to more rapid and non-destructive prediction of seed viability in eggplant germplasm preserved in the National Agrobiodiversity Center of Rural Development Administration Republic of Korea. A total of 198 grains of IT208418 were used for the X-ray imaging and the germination test. The internal images of each grain were scanned at 40kV voltage and 0.6mA current, and the mean and standard deviation of the pixels were calculated using analysis software named Harmony-50. The germination test was conducted for the reliable determination of seed viability in each X-rayed grain. To examine the correlation between X-ray image values and germination response, data were analyzed by using t-test at confidence level of 95%. The result showed a positive correlation between them (r² = 0.85, P ≤ 0.003). Any decline of the germination rate by repeated X-ray irradiation was not observed. We expect that the X-ray imaging could be applied to non-destructive prediction of seed viability in eggplant.