/AnMtgsAbsts2009.54220
Electrical Conductivity Test for Maize Seeds Stored at Low Temperature.
Monday, November 2, 2009
Convention Center, Exhibit Hall BC, Second Floor
Roberval D. Vieira, Mariana S. Rosa and Claudia D. Silva, Crop Science, São Paulo State Univ., UNESP, Jaboticabal, SP, Brazil
Electrical conductivity test is recommended to evaluate vigor of pea
seeds and suggested for soybean. However, some cares must be taken for this
test, especially when conducted for seeds stored at low temperature. As observed
for soybean seeds the EC test does not show reduction of vigor of soybean seeds
stored at low temperature. Thus, the present work was carried out in order to
verify the effect of the rest time at higher temperature, before imbibition, on the electrical conductivity results of maize
seeds stored at low temperature (10°C
and 60% of air relative humidity). Five seed
lots with similar germination levels were used. The laboratory analysis (seed moisture
content; germination and vigor: accelerated aging, cold and electrical
conductivity tests) were performed initially and repeated periodically after
four, eight, 12 and 16 months of storage. Since the second evaluation (four
months of storage) a new variable was added to the electrical conductivity
test, denominated rest time of the seeds, used between the removal of the seeds
from the cold chamber and the beginning of the imbibition for the electrical
conductivity test. Rest time periods of zero, six, 12 and 24 hours were used,
at two temperatures, 20 e 25 to 30°C
(laboratory environment), aimed to verify, in this way, the effect of these
periods and temperatures on the results of the electrical conductivity
throughout of the storage periods at low temperature. Maize seeds showed
increases of the electrical conductivity values throughout the storage period
in all rest time used. Rest temperatures of 20 and 25 to 30°C caused no
significant changes in the results of electrical conductivity. The rest time of
12 and 24 hours were the most indicated for maize seeds.