Grain mold of sorghum is one of the most important constraints affecting grain yield, seed viability and grain quality. Several plant breeding programs have been created to face this problem, but the results have been only partially successful. In recent years an increase interest in combining plant molecular techniques in a plant breeding program have led investigators to focus on responsive traits that in combination confer improved resistance to mold. Quantitative trait loci (QTL) for grain mold resistance is a popular technique that mark and allow the localization in the sorghum genome of all related mold resistance genes through molecular markers. In this project related mold resistance genes are being investigated at the gene expression level in two sorghum cultivars, Sureno and TX430 and 140 recombinants inbred lines (RILs) derived from these parents after being inoculated with two pathogens (Curvularia lunata, and Fusarium thapsinum). Common up-regulated genes among parents and RILs will be identified by cDNA subtraction hybridization technique and molecular markers that co-segregate with these genes will be generated by QTL analysis. The QTL analysis of transcript levels will be presented.