Pawn K. Singh1, Mohamed Mergoum1, and Geoffrey Hughes2. (1) Plant Sciences, NDSU, Loftsgard Hall, P.O. Box 5051, Fargo, ND 58105, (2) University of Saskatchewan, Dept. of Plant Sciences, Saskatoon, SK S7N5A8, Canada
Tan spot, a foliar disease of durum and common wheat, causes 5-15% yield losses and adversely affects the quality of grain. On susceptible hosts, P. tritici-repentis induces two phenotypically distinct symptoms, tan necrosis and chlorosis. The objectives of this study were to determine the inheritance of resistance to tan necrosis caused by P. tritici-repentis, race 1, in tetraploid wheat line T. turgidum # 283, and hexaploid wheat genotypes, Synthetic Hexaploid Elite # 1, Synthetic Septoria # 57, Intros # 7, 2000 Spelt # 20, and CIMMYT L # 18. Additionally the allelic relationship between the resistance gene(s) possessed by these genetically diverse resistant sources was also determined. The F1, and F2 plants and F2:3 families of resistant/susceptible and resistant/resistant crosses were studied under controlled environmental conditions. Plants were inoculated at the 2-leaf stage and disease reaction was assessed eight days after inoculation based on 1-5 lesion type scale. Tests of the F1 and F2 generations and of F2:3 families indicated that one recessive gene controlled resistance to the necrosis component of tan spot caused by race 1 in each cross studied in both tetraploid and hexaploid wheat. Lack of segregation in crosses between the resistant cultivars indicated that the resistance gene was the same in all the cultivars.
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