The wheat foliar diseases, tan spot, septoria tritici blotch, and stagonospora nodorum blotch, form the major components of the leaf spotting disease complex in North America. A complex of these diseases occurs in wheat fields hence managing leaf spots is difficult. Control of leaf spots through management practices and fungicides application is possible however the use of resistant varieties is the most effective and economical means of controlling leaf spots. This study was conducted to determine the reaction of 126 advanced spring wheat breeding lines from Northern Plains of USA to individual races/pathogens that cause leaf spots. This vital information is a prerequisite for development of leaf spot resistant varieties. The genotypes were screened under controlled environmental conditions to three virulent races 2, 3, and 5 of Pyrenophora tritici-repentis and to isolates of foliar pathogens Stagonospora nodorum and Mycosphaerella graminicola. Resistant lines/varieties were identified to the different races/pathogens causing leaf spots. Presently breeding efforts are being made to pyramid all the leaf spot resistance genes in order to develop resistant varieties effective against all races/pathogens causing leaf spots.